We present new experimental results on the sensitivity of commercial SRAMs to very low-LET ionizing particles (2-MeV protons), identifying the different kinds of errors (soft and hard) occurring upon irradiation. The tests were run at a low-energy accelerator, demonstrating the suitability of such facilities to SEU testing of modern electronics.
Exploiting a Low-Energy Accelerator to Test Commercial Electronics
M. BAGATIN;CESTER, ANDREA
2006
Abstract
We present new experimental results on the sensitivity of commercial SRAMs to very low-LET ionizing particles (2-MeV protons), identifying the different kinds of errors (soft and hard) occurring upon irradiation. The tests were run at a low-energy accelerator, demonstrating the suitability of such facilities to SEU testing of modern electronics.
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