Development of a multi-configuration support for the comparison of X-ray computed tomography and optical profilometry surface texture measurements

The comparison of measurements from different instruments is an increasingly common task in advanced metrology. One case in point is the calibration of measuring machines using task-specific calibration artefacts. Another example is when two different measurement technologies are combined, e.g., to emphasise their strengths and mitigate their weaknesses. The study presents a practical case where design for metrology principles were applied to create a versatile additively manufactured support for test specimens. This support, compatible with both X-ray computed tomography and optical profilometry, not only serves the purpose of holding the specimen in place but it is also designed to include specific common features to assist in the subsequent data alignment operations, that would be otherwise challenging due to the high complexity of AM surface topography.