Experimental investigation of the influencing factors on the structural resolution for dimensional measurements with CT systems

This paper presents an experimental investigation on the factors influencing the metrological structural resolution (MSR) of CT systems. The investigation consists of structured experiments involving several CT data acquisition and processing parameters. The method used to assess the metrological structural resolution is based on the amplitude transfer function (ATF). Because of the intrinsic relation between structural resolution and noise, the extracted surface RMS deviation was also evaluated. The results show how dependent the MSR is on the influencing factors and provides useful functional relations between data acquisition and processing parameters, the MSR and the surface deviations. They also help demonstrating the applicability of the ATF-based method to characterize the metrological structural resolution of CT systems.