Polychromatic polarizing microscopy (PPM) is a new optical technique that allows for the inspection of materials with low birefringence, which produces retardance between 1 nm and 300 nm. In this region, where minerals display interference colors in the near-black to gray scale and where observations by conventional microscopy are limited or hampered, PPM produces a full spectrum color palette in which the hue depends on orientation of the slow axis. We applied PPM to ordinary 30 µ.m rock thin sections, with particular interest in the subtle birefringence of garnet due both to non-isotropic growth or to strain induced by external stresses or inclusions. The PPM produces striking, colorful images that highlight various types of microstructures that are virtually undetectable by conventional polarizing microscopy. PPM opens new avenues for microstructural analysis of geological materials. The direct detection and imaging of microstructures will provide a fast, non-destructive, and inexpe...

Polychromatic polarization: Boosting the capabilities of the good old petrographic microscope

Cesare, Bernardo
;
2022

Abstract

Polychromatic polarizing microscopy (PPM) is a new optical technique that allows for the inspection of materials with low birefringence, which produces retardance between 1 nm and 300 nm. In this region, where minerals display interference colors in the near-black to gray scale and where observations by conventional microscopy are limited or hampered, PPM produces a full spectrum color palette in which the hue depends on orientation of the slow axis. We applied PPM to ordinary 30 µ.m rock thin sections, with particular interest in the subtle birefringence of garnet due both to non-isotropic growth or to strain induced by external stresses or inclusions. The PPM produces striking, colorful images that highlight various types of microstructures that are virtually undetectable by conventional polarizing microscopy. PPM opens new avenues for microstructural analysis of geological materials. The direct detection and imaging of microstructures will provide a fast, non-destructive, and inexpe...
2022
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11577/3443690
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