Experimental study of leakage-delay trade-off in Germanium pMOSFETs for logic circuits

Magnone, P; Crupi, F; Alioto, M; Kaczer, B

doi:10.1109/ISCAS.2010.5537514

Experimental study of leakage-delay trade-off in Germanium pMOSFETs for logic circuits

Magnone P;Crupi F;Alioto M;Kaczer B

2010

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	Anno
	
				2010
			
	Titolo del Libro
	
				Circuits and Systems (ISCAS), Proceedings of 2010 IEEE International Symposium on
			
	Titolo convegno
	
				Circuits and Systems (ISCAS), Proceedings of 2010 IEEE International Symposium on
			
	Codice DOI
	
				https://dx.doi.org/10.1109/ISCAS.2010.5537514
			
	Codice WOS
	
				WOS:000287216001237
			
	Codice Scopus
	
				2-s2.0-77955990527
			
	Codice ISBN
	
				978-1-4244-5308-5
			
	Appare nelle tipologie:
	
				04.01 - Contributo in atti di convegno