Feedback bridging faults may give rise to oscillations within integrated circuits. This work mainly investigates the propagation of oscillations, a behavior that may have a relevant impact on the fault detection.We propose both a logic-level model of the faulty circuit and two techniques aiming to the generation of high-quality test sequences.
Boolean and pseudo-boolean test generation for feedback bridging faults
DALPASSO, MARCELLO
2016
Abstract
Feedback bridging faults may give rise to oscillations within integrated circuits. This work mainly investigates the propagation of oscillations, a behavior that may have a relevant impact on the fault detection.We propose both a logic-level model of the faulty circuit and two techniques aiming to the generation of high-quality test sequences.File in questo prodotto:
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