This work deals with a practical approach for determining the metrological structure resolution in X-ray Computed Tomography (CT) for dimensional measurements in manufacturing. Advantages over other applicable approaches are discussed. The experimental results obtained from the implementation of the method using a micro-CT system are compared with the geometrical unsharpness of CT reconstructions.
Practical method for determining the metrological structure resolution of dimensional CT
CARMIGNATO, SIMONE;BALCON, MANUEL;PARISATTO, MATTEO
2013
Abstract
This work deals with a practical approach for determining the metrological structure resolution in X-ray Computed Tomography (CT) for dimensional measurements in manufacturing. Advantages over other applicable approaches are discussed. The experimental results obtained from the implementation of the method using a micro-CT system are compared with the geometrical unsharpness of CT reconstructions.
File in questo prodotto:
Non ci sono file associati a questo prodotto.
Pubblicazioni consigliate
I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.
