We have measured the growth of liquid films of Ar adsorbed on well defined arrays of microscopic linear wedges sculpted on thin Si wafers and on a stainless steel disk. On these patterns, a clear cross-over from a planarlike to a geometry dependent growth behavior is observed. This crossover is found to depend on the characteristic wedge size. Near liquid-vapor bulk coexistence, the film mass is observed to diverge as a power law of the chemical potential difference from saturation with an exponent in very good agreement with the value of -2 expected for a linear wedge. This exponent is not affected by the opening angles of the wedges. All these findings are in accordance with a recent scaling theory.

Complete wetting on a linear wedge

BRUSCHI, LORENZO;MISTURA, GIAMPAOLO
2002

Abstract

We have measured the growth of liquid films of Ar adsorbed on well defined arrays of microscopic linear wedges sculpted on thin Si wafers and on a stainless steel disk. On these patterns, a clear cross-over from a planarlike to a geometry dependent growth behavior is observed. This crossover is found to depend on the characteristic wedge size. Near liquid-vapor bulk coexistence, the film mass is observed to diverge as a power law of the chemical potential difference from saturation with an exponent in very good agreement with the value of -2 expected for a linear wedge. This exponent is not affected by the opening angles of the wedges. All these findings are in accordance with a recent scaling theory.
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11577/2464579
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