The site (fcc or hcp) occupied by the atoms of a Ni ML deposited on Pt(111) is determined in this paper using angle-scanned photoelectron diffraction (PD). A full 2π MgKα-excited Ni-2p3/2 PD pattern from 1-ML Ni deposited on Pt(111) is compared to single scattering cluster-spherical wave (SSC-SW) simulations and the agreement between experimental and theoretical data is quantified by R-factor analysis. From the present investigation it turns out that Ni atoms occupy hcp sites. In addition, the Ni-Pt distance has been estimated to be 2.5±0.1 Å.
Determination of the overlayer/substrate registry in Ni(1ML)/Pt(111) by angle-scanned photoelectron diffraction
SAMBI, MAURO;GRANOZZI, GAETANO
1995
Abstract
The site (fcc or hcp) occupied by the atoms of a Ni ML deposited on Pt(111) is determined in this paper using angle-scanned photoelectron diffraction (PD). A full 2π MgKα-excited Ni-2p3/2 PD pattern from 1-ML Ni deposited on Pt(111) is compared to single scattering cluster-spherical wave (SSC-SW) simulations and the agreement between experimental and theoretical data is quantified by R-factor analysis. From the present investigation it turns out that Ni atoms occupy hcp sites. In addition, the Ni-Pt distance has been estimated to be 2.5±0.1 Å.
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