An angle-scanned X-ray photoelectron diffraction (XPD) study of the polar Zn-terminated ZnO(0001) surface has been carried out in order to look for a hypothetical inward relaxation of the outermost Zn layer. From the comparison of the O 1s polar scan with single-scattering-cluster (SSC) simulations it is clearly evident that the surface is bulk terminated and any relaxation is ruled out. Moreover, the capability of the XPD technique in determining the surface polarity (atomic termination) by inspection of θ/φ 2D plots without the aid of theoretical simulations has been demonstrated
An Angle-Scanned Photoelectron Diffraction Study on the Surface Relaxation of ZnO (0001)
SAMBI, MAURO;GRANOZZI, GAETANO;RIZZI, GIAN-ANDREA;CASARIN, MAURIZIO;TONDELLO, EUGENIO
1994
Abstract
An angle-scanned X-ray photoelectron diffraction (XPD) study of the polar Zn-terminated ZnO(0001) surface has been carried out in order to look for a hypothetical inward relaxation of the outermost Zn layer. From the comparison of the O 1s polar scan with single-scattering-cluster (SSC) simulations it is clearly evident that the surface is bulk terminated and any relaxation is ruled out. Moreover, the capability of the XPD technique in determining the surface polarity (atomic termination) by inspection of θ/φ 2D plots without the aid of theoretical simulations has been demonstratedFile in questo prodotto:
Non ci sono file associati a questo prodotto.
Pubblicazioni consigliate
I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.
