This paper reports a rapid electron spin resonance method to assess the dynamical properties of spin-labeled alkyl carboxylate layers, covalently linked onto a porous silicon substrate. IR and X-ray photoelectron spectroscopy analyses complemented the ESR study by proving the successful grafting of the organic radical and coverage of the surface.

Dynamics of a Nitroxide Layer Grafted onto Porous Silicon

BUSOLO, FILIPPO;FRANCO, LORENZO;ARMELAO L;MAGGINI, MICHELE
2010

Abstract

This paper reports a rapid electron spin resonance method to assess the dynamical properties of spin-labeled alkyl carboxylate layers, covalently linked onto a porous silicon substrate. IR and X-ray photoelectron spectroscopy analyses complemented the ESR study by proving the successful grafting of the organic radical and coverage of the surface.
2010
File in questo prodotto:
Non ci sono file associati a questo prodotto.
Pubblicazioni consigliate

I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.

Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11577/2450031
Citazioni
  • ???jsp.display-item.citation.pmc??? ND
  • Scopus 11
  • ???jsp.display-item.citation.isi??? 11
  • OpenAlex ND
social impact