Waveguides obtained by proton exchange in LiNbO3 were characterized by Secondary Ion Mass Spectrometry and m-lines technique. Additional micro-Raman investigations evidenced marked changes in the spectra of the waveguide with respect to the substrate. This suggests that micro-Raman spectroscopy may constitute a direct non-destructive method to determine the depth of the exchanged layer, with a limit which is set by the diffraction-limited spot size.
Characterization of waveguides obtained by proton exchange on a LiNbO3 substrate
SADA, CINZIA;
2001
Abstract
Waveguides obtained by proton exchange in LiNbO3 were characterized by Secondary Ion Mass Spectrometry and m-lines technique. Additional micro-Raman investigations evidenced marked changes in the spectra of the waveguide with respect to the substrate. This suggests that micro-Raman spectroscopy may constitute a direct non-destructive method to determine the depth of the exchanged layer, with a limit which is set by the diffraction-limited spot size.
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