Growths of nanophased Cu, CuO, Cu-TiO2 and Cu2O-TiO2 thin films were performed by using titanium tetraisopropoxide Ti((OPr)-Pr-i)(4), and copper(II)acetylacetonatehydrate Cu(acac)(2)(H2O)-H-. in the temperature range 275-370degreesC. The composite Cu-TiO2 with very low percent of titanium dioxide (TiO2<5%) can be an alternative procedure to obtain well adherent, smooth and well connected Cu films. Cu2O-TiO2 were obtained by annealing of Cu-TiO2 thin films. Cu2O in a TiO2 matrix remains unaltered after repeated thermal treatments when the Cu:Ti metal ratio is equal or less than 15:1. The films exhibited semiconductor characteristics with a moderate transparency, 40-60% in the visible region

Conductive Cu-TiO2 thin films obtained via MOCVD

FREGONA, DOLORES;
2002

Abstract

Growths of nanophased Cu, CuO, Cu-TiO2 and Cu2O-TiO2 thin films were performed by using titanium tetraisopropoxide Ti((OPr)-Pr-i)(4), and copper(II)acetylacetonatehydrate Cu(acac)(2)(H2O)-H-. in the temperature range 275-370degreesC. The composite Cu-TiO2 with very low percent of titanium dioxide (TiO2<5%) can be an alternative procedure to obtain well adherent, smooth and well connected Cu films. Cu2O-TiO2 were obtained by annealing of Cu-TiO2 thin films. Cu2O in a TiO2 matrix remains unaltered after repeated thermal treatments when the Cu:Ti metal ratio is equal or less than 15:1. The films exhibited semiconductor characteristics with a moderate transparency, 40-60% in the visible region
2002
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11577/1345671
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