MANUZZATO, ANDREA
 Distribuzione geografica
Continente #
NA - Nord America 680
AS - Asia 110
EU - Europa 93
OC - Oceania 2
AF - Africa 1
Totale 886
Nazione #
US - Stati Uniti d'America 680
CN - Cina 70
IT - Italia 39
SG - Singapore 21
FI - Finlandia 19
DE - Germania 9
HK - Hong Kong 9
FR - Francia 8
UA - Ucraina 8
GB - Regno Unito 5
KR - Corea 5
RU - Federazione Russa 3
IL - Israele 2
NZ - Nuova Zelanda 2
SE - Svezia 2
TW - Taiwan 2
DZ - Algeria 1
IR - Iran 1
Totale 886
Città #
Fairfield 94
Woodbridge 88
Houston 86
Ann Arbor 61
Seattle 51
Cambridge 42
Ashburn 40
Wilmington 38
Jacksonville 36
Singapore 16
Beijing 15
Chandler 14
Boardman 13
Santa Clara 12
Princeton 11
Helsinki 10
Roxbury 10
Medford 9
San Diego 9
Nanjing 8
Des Moines 7
Cagliari 6
Jinan 6
Hong Kong 5
Changsha 4
Dallas 3
Freising 3
Milan 3
Redmond 3
Seoul 3
Shanghai 3
Shenyang 3
Venice 3
Fiorenzuola d'Arda 2
Fuzhou 2
Guangzhou 2
Kilburn 2
Ningbo 2
Ogden 2
Orange 2
Paris 2
Pramaggiore 2
Queens 2
Rome 2
Taipei 2
Xi'an 2
Cartoceto 1
Central 1
Christchurch 1
Gunzenhausen 1
Hebei 1
Huntsville 1
Jiaxing 1
Mel 1
Montpellier 1
Moscow 1
Nanchang 1
Napoli 1
New Bedfont 1
Norwalk 1
Osimo 1
Padova 1
Palmerton 1
Parma 1
Taiyuan 1
Tauranga 1
Tianjin 1
Torino 1
Turin 1
Walnut 1
Zanjan 1
Totale 766
Nome #
Single Event Effects On FPGAs 116
On the Evaluation of Radiation-Induced Transient Faults in Flash-Based FPGAs 110
Layout-Aware Multi-Cell Upsets Effects Analysis on TMR Circuits Implemented on SRAM-Based FPGAs 98
On the static cross section of SRAM-based FPGAs 95
Layout-aware multi-cell upsets effects analysis on TMR circuits implemented on SRAM-based FPGAs 90
Methodologies to Study Frequency-Dependent Single Event Effects Sensitivity in Flash-Based FPGAs 89
Effectiveness of TMR-Based Techniques to Mitigate Alpha-Induced SEU Accumulation in Commercial SRAM-Based FPGAs 76
A new hardware/software platform and a new 1/E neutron source for soft error studies: Testing FPGAs at the ISIS facility 76
Sensitivity evaluation of TMR-hardened circuits to multiple SEUs induced by alpha particles in commercial SRAM-based FPGAs 73
Effectiveness of TMR-based techniques to mitigate alpha-induced SEU accumulation in commercial FPGAs 71
Totale 894
Categoria #
all - tutte 3.381
article - articoli 1.306
book - libri 0
conference - conferenze 0
curatela - curatele 0
other - altro 0
patent - brevetti 0
selected - selezionate 0
volume - volumi 0
Totale 4.687


Totale Lug Ago Sett Ott Nov Dic Gen Feb Mar Apr Mag Giu
2019/2020130 0 0 0 0 0 12 18 21 37 20 17 5
2020/202174 7 5 5 13 0 3 2 7 17 7 5 3
2021/2022130 8 8 21 9 1 4 1 22 4 10 15 27
2022/202377 18 0 2 6 9 12 4 3 12 5 4 2
2023/202470 0 9 5 4 3 6 2 7 15 9 6 4
2024/202579 4 8 9 22 25 11 0 0 0 0 0 0
Totale 894